1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
Business processes can be very large and may contain several different concerns, scattered across the process and tangled with other concerns. Crosscutting concerns are difficult t...
Automated analog sizing is becoming an unavoidable solution for increasing analog design productivity. The complexity of typical analog SoC subsystems however calls for efficient ...
Georges G. E. Gielen, Trent McConaghy, Tom Eeckela...
We illustrate how technical contributions in the VLSI CAD partitioning literature can fail to provide one or more of: (i) reproducible results and descriptions, (ii) an enabling a...
Andrew E. Caldwell, Andrew B. Kahng, Andrew A. Ken...
In this paper, we describe NoCGEN, a Network On Chip (NoC) generator, which is used to create a simulatable and synthesizable NoC description. NoCGEN uses a set of modularised rou...