3879 search results - page 218 / 776 » PyPBS design and methodologies |
122
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DAC
2000
ACM
16 years 6 months ago
2000
ACM
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
115
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DATE
2003
IEEE
15 years 10 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
134
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SAC
2009
ACM
15 years 11 months ago
2009
ACM
Today several approaches using Situational Method Engineering paradigm exist, each of them proposes methods and techniques for developing ad-hoc design processes. In this context ...
123
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MEMOCODE
2007
IEEE
15 years 11 months ago
2007
IEEE
—With the arrival of nanometer technologies wire delays are no longer negligible with respect to gate delays, and timing-closure becomes a major challenge to System-on-Chip desig...
137
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ISCAS
1999
IEEE
15 years 9 months ago
1999
IEEE
High-level power design presents a complex, multiobjective problem that involves the simultaneous optimisation of competing criteria such as speed, area and power. It is difficult...