3879 search results - page 721 / 776 » PyPBS design and methodologies |
132
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
134
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—Static and dynamic variations, which have negative impact on the reliability of microelectronic systems, increase with smaller CMOS technology. Thus, further downscaling is only...
144
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CODES
2002
IEEE
15 years 9 months ago
2002
IEEE
High-speed serial network interfaces are gaining wide use in connecting multiple processors and peripherals in modern embedded systems, thanks to their size advantage and power ef...
146
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EH
2002
IEEE
15 years 9 months ago
2002
IEEE
It is argued that natural evolution is, par excellence, an algorithm that exploits the physical properties of materials. Such an exploitation of the physical characteristics has a...
143
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GLVLSI
2002
IEEE
15 years 9 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...