31 search results - page 4 / 7 » Quality considerations in delay fault testing |
DATE
2010
IEEE
15 years 2 months ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
IOLTS
2000
IEEE
15 years 1 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
ASPDAC
2004
ACM
15 years 2 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
HIS
2009
14 years 7 months ago
2009
The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...
102
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ATS
2010
IEEE
14 years 7 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...