2555 search results - page 62 / 511 » Quantifiers and Working Memory |
NMA
2010
14 years 7 months ago
2010
A stochastic model of the resistive switching mechanism in bipolar oxide-based resistive random access memory (RRAM) is presented. The distribution of electron occupation probabili...
ICSE
2008
IEEE-ACM
15 years 10 months ago
2008
IEEE-ACM
A memory leak in a Java program occurs when object references that are no longer needed are unnecessarily maintained. Such leaks are difficult to understand because static analyse...
MTDT
2003
IEEE
15 years 3 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
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ISCA
2011
IEEE
14 years 1 months ago
2011
IEEE
In this paper we study the impact of sharing memory resources on five Google datacenter applications: a web search engine, bigtable, content analyzer, image stitching, and protoc...
FPGA
2000
ACM
15 years 1 months ago
2000
ACM
It has become clear that on-chip storage is an essential component of high-density FPGAs. These arrays were originally intended to implement storage, but recent work has shown tha...