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95
Voted
ITC
1994
IEEE
90views Hardware» more  ITC 1994»
15 years 4 months ago
Defect Classes - An Overdue Paradigm for CMOS IC
: The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...
Charles F. Hawkins, Jerry M. Soden, Alan W. Righte...
96
Voted
ICSE
2001
IEEE-ACM
15 years 5 months ago
Fast Formal Analysis of Requirements via "Topoi Diagrams"
Early testing of requirements can decrease the cost of removing errors in software projects. However, unless done carefully, that testing process can significantly add to the cos...
Tim Menzies, John D. Powell, Michael E. Houle
104
Voted
ESANN
2000
15 years 2 months ago
Bootstrapping Self-Organizing Maps to assess the statistical significance of local proximity
One of the attractive feature of Self-Organizing Maps (SOM) is the so-called "topological preservation property": observations that are close to each other in the input s...
Eric de Bodt, Marie Cottrell
78
Voted
CORR
2010
Springer
47views Education» more  CORR 2010»
15 years 24 days ago
Robustness and Generalization
We derive generalization bounds for learning algorithms based on their robustness: the property that if a testing sample is "similar" to a training sample, then the test...
Huan Xu, Shie Mannor
77
Voted
COCOON
2001
Springer
15 years 5 months ago
PC-Trees vs. PQ-Trees
A data structure called PC-tree is introduced as a generalization of PQ-trees. PC-trees were originally introduced in a planarity test of Shih and Hsu [7] where they represent par...
Wen-Lian Hsu