2774 search results - page 108 / 555 » Query-Driven Program Testing |
TSE
2010
14 years 8 months ago
2010
This paper presents an innovative model of a program’s internal behavior over a set of test inputs, called the probabilistic program dependence graph (PPDG), that facilitates pr...
VLSID
2007
IEEE
15 years 10 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ICCAD
1999
IEEE
15 years 2 months ago
1999
IEEE
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
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AGILEDC
2004
IEEE
15 years 1 months ago
2004
IEEE
Strong unit testing is the foundation of agile software development but embedded systems present special problems. Test of embedded software is bound up with test of hardware, cro...
SCAM
2008
IEEE
15 years 4 months ago
2008
IEEE
Traditional mutation testing considers only first order mutants, created by the injection of a single fault. Often these first order mutants denote trivial faults that are easil...