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ISCAS
2005
IEEE
121views Hardware» more  ISCAS 2005»
15 years 3 months ago
SET and RESET pulse characterization in BJT-selected phase-change memories
- This paper presents program pulse characterization in an 8-Mb BJT-selected Phase-Change Memory test chip. Experimental results of the impact of the bit-line resistance over progr...
Ferdinando Bedeschi, Edoardo Bonizzoni, Giulio Cas...
ICCS
2004
Springer
15 years 3 months ago
Designing Digital Circuits for the Knapsack Problem
Abstract. Multi Expression Programming (MEP) is a Genetic Programming variant that uses linear chromosomes for solution encoding. A unique feature of MEP is its ability of encoding...
Mihai Oltean, Crina Grosan, Mihaela Oltean
EUROGP
2001
Springer
106views Optimization» more  EUROGP 2001»
15 years 2 months ago
Linear-Tree GP and Its Comparison with Other GP Structures
Abstract. In recent years different genetic programming (GP) structures have emerged. Today, the basic forms of representation for genetic programs are tree, linear and graph stru...
Wolfgang Kantschik, Wolfgang Banzhaf
ACMSE
2006
ACM
15 years 4 months ago
Automatic support for testing web-based enterprise applications
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...
Arturo Sanchez, Brandon Vega, Alexander Gonzalez, ...
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ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 2 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...