In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
C's volatile qualifier is intended to provide a reliable link between operations at the source-code level and operations at the memorysystem level. We tested thirteen product...
Abstract--Despite much progress, developing a pervasive computing application remains a challenge because of a lack of conceptual frameworks and supporting tools. This challenge in...
This paper presents the results of an exploratory study on the fault-proneness of aspect-oriented programs. We analysed the faults collected from three evolving aspect-oriented sy...
WS-BPEL applications are a kind of service-oriented application. They use XPath extensively to integrate loosely-coupled workflow steps. However, XPath may extract wrong data from...