2 search results - page 1 / 1 » Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method |
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DT
2006
15 years 1 months ago
2006
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ICCAD
2003
IEEE
15 years 10 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...