29 search results - page 6 / 6 » RESIST: a recursive test pattern generation algorithm for pa... |
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
ITC
2002
IEEE
13 years 11 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
JSS
2008
13 years 4 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...