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ETS
2006
IEEE
110views Hardware» more  ETS 2006»
16 years 3 days ago
Deterministic Logic BIST for Transition Fault Testing
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
Valentin Gherman, Hans-Joachim Wunderlich, Jü...
ISESE
2006
IEEE
16 years 2 days ago
Predicting component failures at design time
How do design decisions impact the quality of the resulting software? In an empirical study of 52 ECLIPSE plug-ins, we found that the software design as well as past failure histo...
Adrian Schröter, Thomas Zimmermann, Andreas Z...
SIGMETRICS
2006
ACM
156views Hardware» more  SIGMETRICS 2006»
16 years 13 hour ago
Maximizing throughput in wireless networks via gossiping
A major challenge in the design of wireless networks is the need for distributed scheduling algorithms that will efficiently share the common spectrum. Recently, a few distributed...
Eytan Modiano, Devavrat Shah, Gil Zussman
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 11 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
ISCAS
2005
IEEE
133views Hardware» more  ISCAS 2005»
15 years 11 months ago
Multiobjective VLSI cell placement using distributed simulated evolution algorithm
— Simulated Evolution (SimE) is a sound stochastic approximation algorithm based on the principles of adaptation. If properly engineered it is possible for SimE to reach nearopti...
Sadiq M. Sait, Ali Mustafa Zaidi, Mustafa I. Ali