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NECO
2011
14 years 6 months ago
Least Squares Estimation Without Priors or Supervision
Selection of an optimal estimator typically relies on either supervised training samples (pairs of measurements and their associated true values), or a prior probability model for...
Martin Raphan, Eero P. Simoncelli
BMCBI
2007
149views more  BMCBI 2007»
14 years 11 months ago
Robust imputation method for missing values in microarray data
Background: When analyzing microarray gene expression data, missing values are often encountered. Most multivariate statistical methods proposed for microarray data analysis canno...
Dankyu Yoon, Eun-Kyung Lee, Taesung Park
110
Voted
GEOINFORMATICA
2007
148views more  GEOINFORMATICA 2007»
14 years 11 months ago
Assessing the Certainty of Locations Produced by an Address Geocoding System
Addresses are the most common georeferencing resource people use to communicate to others a location within a city. Urban GIS applications that receive data directly fromcitizens,...
Clodoveu A. Davis, Frederico T. Fonseca
CORR
2007
Springer
110views Education» more  CORR 2007»
14 years 11 months ago
Graph Annotations in Modeling Complex Network Topologies
abstract such additional information as network annotations. We introduce a network topology modeling framework that treats annotations as an extended correlation profile of a net...
Xenofontas A. Dimitropoulos, Dmitri V. Krioukov, A...
DATE
2009
IEEE
125views Hardware» more  DATE 2009»
15 years 6 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu