402 search results - page 49 / 81 » Random Search for Hyper-Parameter Optimization |
SARA
2009
Springer
15 years 2 months ago
2009
Springer
Abstract. This article presents two new algorithms whose purpose is to maintain the Max-RPC domain filtering consistency during search with a minimal memory footprint and implemen...
VTS
1997
IEEE
15 years 1 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
EVOW
2008
Springer
14 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
NIPS
2004
14 years 11 months ago
2004
Embedding algorithms search for low dimensional structure in complex data, but most algorithms only handle objects of a single type for which pairwise distances are specified. Thi...
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GLOBECOM
2007
IEEE
14 years 9 months ago
2007
IEEE
Abstract— Many techniques for constructing unitary spacetime constellations have been proposed. To minimize bit-error rate (BER) in a wireless communication system, constellation...