28 search results - page 2 / 6 » Randomization Based Probabilistic Approach to Detect Trojan ... |
MICRO
2006
IEEE
13 years 6 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
VLSID
1993
IEEE
13 years 10 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
LCN
2005
IEEE
13 years 12 months ago
2005
IEEE
— The sensing capabilities of networked sensors are affected by environmental factors in real deployment and it is imperative to have practical considerations at the design stage...
ICCAD
2003
IEEE
14 years 3 months ago
2003
IEEE
As current silicon-based techniques fast approach their practical limits, the investigation of nanoscale electronics, devices and system architectures becomes a central research p...
ITC
1996
IEEE
13 years 10 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...