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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 10 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
AAAI
2010
13 years 3 months ago
A Topic Model for Linked Documents and Update Rules for its Estimation
The latent topic model plays an important role in the unsupervised learning from a corpus, which provides a probabilistic interpretation of the corpus in terms of the latent topic...
Zhen Guo, Shenghuo Zhu, Zhongfei Zhang, Yun Chi, Y...
NIPS
2008
13 years 7 months ago
Natural Image Denoising with Convolutional Networks
We present an approach to low-level vision that combines two main ideas: the use of convolutional networks as an image processing architecture and an unsupervised learning procedu...
Viren Jain, H. Sebastian Seung