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100
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FCT
2009
Springer
15 years 4 months ago
2009
Springer
Suppose that we are given a set of n elements d of which are “defective”. A group test can check for any subset, called a pool, whether it contains a defective. It is well know...
CVPR
2004
IEEE
16 years 2 days ago
2004
IEEE
Model-based clustering of motion trajectories can be posed as the problem of learning an underlying mixture density function whose components correspond to motion classes with dif...
DAC
2007
ACM
15 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2006
ACM
15 years 11 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
104
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HPCA
2009
IEEE
15 years 10 months ago
2009
IEEE
Magnetic Random Access Memory (MRAM) is considered to be a promising future memory technology due to its low leakage power, high density and fast read speed. The heterogeneous int...