Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
Ke Meng, Frank Huebbers, Russ Joseph, Yehea I. Ism...
With the evolution of e-commerce, privacy is becoming a major concern. Many e-companies employ collaborative filtering (CF) techniques to increase their sales by providing truthfu...
Current simulation-sampling techniques construct accurate model state for each measurement by continuously warming large microarchitectural structures (e.g., caches and the branch...
Thomas F. Wenisch, Roland E. Wunderlich, Babak Fal...
We study the influence of collision-finding attacks on the security of time-stamping schemes. We distinguish between client-side hash functions used to shorten the documents befo...