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IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
15 years 4 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
ISPASS
2007
IEEE
15 years 4 months ago
Modeling and Characterizing Power Variability in Multicore Architectures
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
Ke Meng, Frank Huebbers, Russ Joseph, Yehea I. Ism...
IWSEC
2007
Springer
15 years 4 months ago
Privacy-Preserving Eigentaste-Based Collaborative Filtering
With the evolution of e-commerce, privacy is becoming a major concern. Many e-companies employ collaborative filtering (CF) techniques to increase their sales by providing truthfu...
Ibrahim Yakut, Huseyin Polat
ISPASS
2006
IEEE
15 years 4 months ago
Simulation sampling with live-points
Current simulation-sampling techniques construct accurate model state for each measurement by continuously warming large microarchitectural structures (e.g., caches and the branch...
Thomas F. Wenisch, Roland E. Wunderlich, Babak Fal...
ACNS
2006
Springer
117views Cryptology» more  ACNS 2006»
15 years 4 months ago
Do Broken Hash Functions Affect the Security of Time-Stamping Schemes?
We study the influence of collision-finding attacks on the security of time-stamping schemes. We distinguish between client-side hash functions used to shorten the documents befo...
Ahto Buldas, Sven Laur
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