2168 search results - page 289 / 434 » Randomized Algorithms and Complexity Theory |
129
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CRYPTO
1989
Springer
15 years 7 months ago
1989
Springer
Abstract. In this paper, we provide a new approach to study undeniable signatures by translating secure digital signatures to secure undeniable signatures so that the existing algo...
119
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VTS
1995
IEEE
15 years 7 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
135
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VLDB
1991
ACM
15 years 7 months ago
1991
ACM
In order to cope efficiently with simple or complex queries as well as different application requirements (e.g., ad-hoc versus repetitive queries), a query optimizer ought to supp...
103
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EVOW
2008
Springer
15 years 5 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
100
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CORR
2010
Springer
15 years 26 days ago
2010
Springer
The stability of low-rank matrix reconstruction is investigated in this paper. The -constrained minimal singular value ( -CMSV) of the measurement operator is shown to determine t...