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122
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AAAI
2008
15 years 6 months ago
2008
We introduce novel algorithms for generating random solutions from a uniform distribution over the solutions of a boolean satisfiability problem. Our algorithms operate in two pha...
145
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AAAI
2008
15 years 6 months ago
2008
The search of a precise measure of what hardness of SAT instances means for state-of-the-art solvers is a relevant research question. Among others, the space complexity of treelik...
131
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CDC
2008
IEEE
15 years 6 months ago
2008
IEEE
In this paper, an input/output system identification technique for the Wiener-Hammerstein model and its feedback extension is proposed. In the proposed framework, the identificatio...
109
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EVOW
2008
Springer
15 years 6 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
127
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ASUNAM
2010
IEEE
15 years 6 months ago
2010
IEEE
Abstract--We present a novel and efficient algorithm, PATH COVERING, for solving the most reliable subgraph problem. A reliable subgraph gives a concise summary of the connectivity...