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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
15 years 10 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
ECCV
2002
Springer
16 years 5 months ago
Visual Data Fusion for Objects Localization by Active Vision
Visual sensors provide exclusively uncertain and partial knowledge of a scene. In this article, we present a suitable scene knowledge representation that makes integration and fusi...
François Chaumette, Grégory Flandin
NIPS
1998
15 years 5 months ago
Divisive Normalization, Line Attractor Networks and Ideal Observers
Gain control by divisive inhibition, a.k.a. divisive normalization, has been proposed to be a general mechanism throughout the visual cortex. We explore in this study the statisti...
Sophie Deneve, Alexandre Pouget, Peter E. Latham
CVPR
2000
IEEE
16 years 5 months ago
Learning in Gibbsian Fields: How Accurate and How Fast Can It Be?
?Gibbsian fields or Markov random fields are widely used in Bayesian image analysis, but learning Gibbs models is computationally expensive. The computational complexity is pronoun...
Song Chun Zhu, Xiuwen Liu
CVPR
2001
IEEE
16 years 5 months ago
Texture Replacement in Real Images
Texture replacement in real images has many applications, such as interior design, digital movie making and computer graphics. The goal is to replace some specified texture patter...
Yanghai Tsin, Yanxi Liu, Visvanathan Ramesh