1511 search results - page 56 / 303 » Randomness, lowness and degrees |
112
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WADS
2009
Springer
15 years 6 months ago
2009
Springer
The time required for a sequence of operations on a data structure is usually measured in terms of the worst possible such sequence. This, however, is often an overestimate of the ...
127
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ATS
2005
IEEE
15 years 5 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
110
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CVPR
2011
IEEE
14 years 8 months ago
2011
IEEE
We address the effects of noise in low-light images in this paper. Color images are usually captured by a sensor with a color filter array (CFA). This requires a demosaicing proc...
COMSUR
2007
14 years 12 months ago
2007
This survey presents the information theory of wideband communication systems, a research area that became active in the last decade following technological and regulatory advance...
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...