143 search results - page 16 / 29 » Randomness versus Fault-Tolerance |
NAACL
2007
14 years 11 months ago
2007
We compare the effect of joint modeling of phonological features to independent feature detectors in a Conditional Random Fields framework. Joint modeling of features is achieved ...
DAC
2008
ACM
15 years 10 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2005
ACM
15 years 10 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
MOBIHOC
2005
ACM
15 years 9 months ago
2005
ACM
Tiny, low-cost sensor devices are expected to be failure-prone and hence in many realistic deployment scenarios for sensor networks these nodes are deployed in higher than necessa...