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» Re-seeding invalidates tests of random number generators
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DATE
2007
IEEE
84views Hardware» more  DATE 2007»
15 years 3 months ago
On test generation by input cube avoidance
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
Irith Pomeranz, Sudhakar M. Reddy
CSCLP
2005
Springer
15 years 3 months ago
On Generators of Random Quasigroup Problems
Problems that can be sampled randomly are a good source of test suites for comparing quality of constraint satisfaction techniques. Quasigroup problems are representatives of struc...
Roman Barták
ECMDAFA
2009
Springer
109views Hardware» more  ECMDAFA 2009»
15 years 4 months ago
Uniform Random Generation of Huge Metamodel Instances
The size and the number of models is drastically increasing, preventing organizations from fully exploiting Model Driven Engineering benefits. Regarding this problem of scalabilit...
Alix Mougenot, Alexis Darrasse, Xavier Blanc, Mich...
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 3 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
SIGSOFT
1998
ACM
15 years 1 months ago
Further Empirical Studies of Test Effectiveness
This paper reports on an empirical evaluation of the fault-detecting ability of two white-box software testing techniques: decision coverage (branch testing) and the all-uses data...
Phyllis G. Frankl, Oleg Iakounenko