Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith...
Automatically acquiring control-knowledge for planning, as it is the case for Machine Learning in general, strongly depends on the training examples. In the case of planning, examp...
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...