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» Re-seeding invalidates tests of random number generators
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ATS
2009
IEEE
117views Hardware» more  ATS 2009»
15 years 4 months ago
N-distinguishing Tests for Enhanced Defect Diagnosis
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith...
ECML
2006
Springer
15 years 1 months ago
Improving Control-Knowledge Acquisition for Planning by Active Learning
Automatically acquiring control-knowledge for planning, as it is the case for Machine Learning in general, strongly depends on the training examples. In the case of planning, examp...
Raquel Fuentetaja, Daniel Borrajo
SEFM
2005
IEEE
15 years 3 months ago
Experimental Evaluation of FSM-Based Testing Methods
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...
Rita Dorofeeva, Nina Yevtushenko, Khaled El-Fakih,...
DATE
2003
IEEE
93views Hardware» more  DATE 2003»
15 years 2 months ago
Comparison of Test Pattern Decompression Techniques
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
Ondrej Novák
ICCD
2004
IEEE
109views Hardware» more  ICCD 2004»
15 years 6 months ago
Low Power Test Data Compression Based on LFSR Reseeding
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
Jinkyu Lee, Nur A. Touba