3001 search results - page 137 / 601 » Recursive type generativity |
179
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
158
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ICCAD
2002
IEEE
15 years 11 months ago
2002
IEEE
IP blocks and large macro cells are increasingly prevalent in physical design, actually causing an increase in the available free space for the dust logic. We observe that top-dow...
159
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VMV
2001
15 years 7 months ago
2001
We present a novel, real-time disparity analysis frame work developed for immersive teleconferencing. This two-stage method computes a limited number of highly reliable disparitie...
203
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VTS
1996
IEEE
15 years 10 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
147
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ICCAD
2001
IEEE
16 years 3 months ago
2001
IEEE
In this work, we present an algorithm for simultaneous template generation and matching. The algorithm profiles the graph and iteratively contracts edges to create the templates. ...