69 search results - page 1 / 14 » Reducing the Complexity of Defect Level Modeling Using the C... |
50
Voted
DATE
2000
IEEE
15 years 5 months ago
2000
IEEE
94
Voted
ATS
2003
IEEE
15 years 6 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
105
Voted
ICPP
2009
IEEE
15 years 7 months ago
2009
IEEE
—In an attempt to increase the performance/cost ratio, large compute clusters are becoming heterogeneous at multiple levels: from asymmetric processors, to different system archi...
110
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ITC
1998
IEEE
15 years 4 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
108
Voted
ICSE
2008
IEEE-ACM
16 years 1 months ago
2008
IEEE-ACM
In software development, resources for quality assurance are limited by time and by cost. In order to allocate resources effectively, managers need to rely on their experience bac...