6568 search results - page 83 / 1314 » Reducing the Complexity of Reductions |
162
Voted
DFT
2009
IEEE
16 years 27 days ago
2009
IEEE
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
212
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EVOW
2007
Springer
16 years 9 days ago
2007
Springer
Abstract. The Traveling Salesman Problem (TSP) is a well-known NPhard combinatorial optimization problem, for which a large variety of evolutionary algorithms are known. However, t...
151
Voted
ISLPED
2005
ACM
15 years 11 months ago
2005
ACM
The instruction scheduling logic used in modern superscalar microprocessors often relies on associative searching of the issue queue entries to dynamically wakeup instructions for...
141
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
166
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ISSS
1999
IEEE
15 years 10 months ago
1999
IEEE
Synchronous Dataflow, a subset of dataflow, has proven to be a good match for specifying DSP programs. Because of the limited amount of memory in embedded DSPs, a key problem duri...