6568 search results - page 86 / 1314 » Reducing the Complexity of Reductions |
160
Voted
DATE
1998
IEEE
15 years 10 months ago
1998
IEEE
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...
161
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VTS
1997
IEEE
15 years 10 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
166
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CEC
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper reports on investigations on the possible advantage of the coupling between genomes and physics of cells in artificial evolution. The idea is simple: evolution can rely ...
130
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AAAI
2008
15 years 8 months ago
2008
We are interested in the problem of reasoning over very large common sense knowledge bases. When such a knowledge base contains noisy and subjective data, it is important to have ...
176
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DSN
2008
IEEE
15 years 8 months ago
2008
IEEE
The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In...