387 search results - page 3 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
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Voted
DFT
2004
IEEE
15 years 1 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
PC
2010
14 years 8 months ago
2010
The fat-tree is one of the topologies most widely used to build high-performance parallel computers. However, they are expensive and difficult to build. In this paper we propose t...
STVR
2002
14 years 9 months ago
2002
Test-suite reduction techniques attempt to reduce the costs of saving and reusing test cases during software maintenance by eliminating redundant test cases from test suites. A po...
ACTAC
1999
14 years 9 months ago
1999
Conformance testing is based on a test suite. Standardization committees release standard test suites, which consist of hundreds of test cases. The main problem of conformance tes...