873 search results - page 112 / 175 » Reducing the Frequent Pattern Set |
123
Voted
ISBI
2006
IEEE
15 years 6 months ago
2006
IEEE
This contribution describes a novel non-contact fluorescence optical tomography scheme which utilizes multiple area illumination patterns, to reduce the illposedness of the inver...
88
Voted
ATS
2004
IEEE
15 years 4 months ago
2004
IEEE
1 This paper describes a heuristic for system-on-chip test scheduling in an abort-on-fail context, where the test is terminated as soon as a defect is detected. We consider an hybr...
102
click to vote
ESTIMEDIA
2006
Springer
15 years 4 months ago
2006
Springer
Nowadays, key characteristics of a processor's instruction set are only exploited in high-level languages by using inline assembly or compiler intrinsics. Inserting intrinsic...
86
Voted
ITC
2000
IEEE
15 years 4 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
142
Voted
JMLR
2012
13 years 3 months ago
2012
Standard compressive sensing results state that to exactly recover an s sparse signal in Rp , one requires O(s · log p) measurements. While this bound is extremely useful in prac...