49 search results - page 3 / 10 » Reduction of Power Dissipation during Scan Testing by Test V... |
ASPDAC
2006
ACM
14 years 7 days ago
2006
ACM
Abstract— For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation...
DAC
1997
ACM
13 years 10 months ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
ASPDAC
2007
ACM
13 years 10 months ago
2007
ACM
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...
DAC
2008
ACM
14 years 7 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
ICCD
2004
IEEE
14 years 3 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...