For the analysis of images, a deeper understanding of their intrinsic structure is required. This has been obtained for 2D images by means of statistical analysis [15, 18]. Here, ...
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
Matthew R. Guthaus, Natesan Venkateswaran, Chandu ...
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...
—As multiprocessor systems are increasingly used in real-time environments, scheduling and synchronization analysis of these platforms receive growing attention. However, most kn...