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    DATE
    2008
    IEEE
    76views Hardware» more  DATE 2008»
    On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
    15 years 4 months ago
    On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
    Download  www.date-conference.com
    Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
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    HICSS
    2008
    IEEE
    92views Biometrics» more  HICSS 2008»
    A Survey on the Flexibility Requirements Related to Business Processes and Modeling Artifacts
    15 years 4 months ago
    A Survey on the Flexibility Requirements Related to Business Processes and Modeling Artifacts
    Download  crinfo.univ-paris1.fr
    Selmin Nurcan
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    TASE
    2008
    IEEE
    96views Software Engineering» more  TASE 2008»
    A Relational Model for Confined Separation Logic
    15 years 4 months ago
    A Relational Model for Confined Separation Logic
    Download  homepages.cwi.nl
    Shuling Wang, Luís Soares Barbosa, Jos&eacu...
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    ECBS
    2007
    IEEE
    111views Hardware» more  ECBS 2007»
    Model-Based Empirical Performance Evaluation Based on Relational Traces
    15 years 4 months ago
    Model-Based Empirical Performance Evaluation Based on Relational Traces
    Download  se.informatik.uni-oldenburg.de
    Empirical performance evaluation is the process of measuring and calculating performance metrics of deployed software systems. It is a part of performance validation during testin...
    Marko Boskovic
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    TACAS
    2007
    Springer
    126views Algorithms» more  TACAS 2007»
    Kodkod: A Relational Model Finder
    15 years 3 months ago
    Kodkod: A Relational Model Finder
    Download  alloy.mit.edu
    Emina Torlak, Daniel Jackson
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