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81
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ISQED
2005
IEEE
95views Hardware» more  ISQED 2005»
15 years 6 months ago
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature
The purpose of this work is to explore how device operation parameters such as switching speed and power dissipation scale with voltage and temperature. We simulated a CMOS ring o...
Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein
118
Voted
NIPS
2003
15 years 2 months ago
Sequential Bayesian Kernel Regression
We propose a method for sequential Bayesian kernel regression. As is the case for the popular Relevance Vector Machine (RVM) [10, 11], the method automatically identifies the num...
Jaco Vermaak, Simon J. Godsill, Arnaud Doucet
102
Voted
JSW
2008
99views more  JSW 2008»
15 years 17 days ago
Using Data Mining in MURA Graphic Problems
The MURA phenomenon will result lots of problems in Photomask and TFT-LCD industries as well. In this paper, we designed and developed a MURA related association rules which suitab...
Wen-Hsing Kao, Jason C. Hung, Victoria Hsu
136
Voted
PAMI
2012
13 years 3 months ago
Joint Depth and Color Camera Calibration with Distortion Correction
—We present an algorithm that simultaneously calibrates two color cameras, a depth camera, and the relative pose between them. The method is designed to have three key features: ...
Daniel Herrera C., Juho Kannala, Janne Heikkil&aum...
SIGSOFT
2008
ACM
16 years 1 months ago
Alchemy: transmuting base alloy specifications into implementations
Alloy specifications are used to define lightweight models of systems. We present Alchemy, which compiles Alloy specifications into implementations that execute against persistent...
Shriram Krishnamurthi, Kathi Fisler, Daniel J. Dou...