An on-chip test-and-measurement system with digital interfaces that can perform device-level characterization of large-dense arrays of transistors is demonstrated in 90- and 65-nm...
Simeon Realov, William McLaughlin, Kenneth L. Shep...
Any mapping S : C → K, where K is a field and C = (C, Σ) is a Σ-algebra, is called a KC-series. These series are natural generalizations of both formal series on strings over...
Multi-modality is a fundamental feature that characterizes biological systems and lets them achieve high robustness in understanding skills while coping with uncertainty. Relativel...
Nicoletta Noceti, Barbara Caputo, Claudio Castelli...
In this work we propose an online reliability tracking framework that utilizes a hybrid network of on-chip temperature and delay sensors together with a circuit reliability macrom...
In speech enhancement applications, a validated metric of noise reduction performance is vital in the relative ranking of noise reduction algorithms and in enhancing the performan...
Nazanin Pourmand, David Suelzle, Vijay Parsa, Yi H...