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WWW
2005
ACM
16 years 16 days ago
2005
ACM
A staggering number of multimedia applications are being introduced every day. Yet, the inordinate delays encountered in retrieving multimedia documents make it difficult to use t...
VLSID
2008
IEEE
16 years 7 days ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
VLSID
2007
IEEE
16 years 7 days ago
2007
IEEE
Leakage power is becoming a dominant contributor to the total power consumption and dual-Vth assignment is an efficient technique to decrease leakage power, for which effective de...
ICCAD
2007
IEEE
15 years 8 months ago
2007
IEEE
— In this paper, we present the first work on the Steiner routing for 3D stacked ICs. In the 3D Steiner routing problem, the pins are located in multiple device layers, which ma...
ICCAD
2002
IEEE
15 years 8 months ago
2002
IEEE
This paper presents an in-depth study of the theory and algorithms for the SPFD-based (Set of Pairs of Functions to be Distinguished) rewiring, and explores the flexibility in the...