The randomness of iris pattern makes it one of the most reliable biometric traits. On the other hand, the complex iris image structure and the various sources of intra-class varia...
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
In this paper we describe an application of OCR techniques to quality control in industrial production. The purpose of the system is to verify the correct printing of numerical in...
Gaining a comprehensive understanding of turbulent flows still poses one of the great challenges in fluid dynamics. A wellestablished approach to advance this research is the an...
Parallel I/O is fast becoming a bottleneck to the research agendas of many users of extreme scale parallel computers. The principle cause of this is the concurrency explosion of hi...
Andrew Uselton, Mark Howison, Nicholas J. Wright, ...