2570 search results - page 411 / 514 » Reliability Modeling Using UML |
115
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DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
137
Voted
HPDC
2005
IEEE
15 years 8 months ago
2005
IEEE
This paper presents novel service-based Grid data management middleware that leverages standards defined by WSRF specifications to create and manage dynamic Grid file system sessi...
133
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BMCBI
2006
15 years 2 months ago
2006
Background: High-density microarray technology is increasingly applied to study gene expression levels on a large scale. Microarray experiments rely on several critical steps that...
127
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BMCBI
2005
15 years 2 months ago
2005
Background: Expressed Sequence Tags (ESTs) are short and error-prone DNA sequences generated from the 5' and 3' ends of randomly selected cDNA clones. They provide an im...
138
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MASS
2010
15 years 14 days ago
2010
Abstract--We present a new scheme to reduce the end-toend routing delay in the mission-critical applications of the wireless sensor networks (WSNs) under the duty cycle model. Whil...