This paper discusses fault-tolerant techniques for SRAM-based FPGAs. These techniques can be based on circuit level modifications, with obvious modifications in the programmable a...
Fernanda Lima Kastensmidt, Gustavo Neuberger, Luig...
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the developmen...
Nicola Campregher, Peter Y. K. Cheung, George A. C...
Fault tolerance is now a primary design constraint for all major microprocessors. One step in determining a processor’s compliance to its failure rate target is measuring the Ar...
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
In the last years, new requirements in terms of vehicle performance increased significantly the amount of on-board electronics, thus raising more concern about safety and fault to...