Data replication is a widely used technique for achieving fault tolerance and improved performance. With the advent of content delivery networks, it is becoming more and more freq...
Bogdan C. Popescu, Bruno Crispo, Andrew S. Tanenba...
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
Many distributed software systems allow participation by large numbers of untrusted, potentially faulty components on an open network. As faults are inevitable in this setting, th...
Yuriy Brun, George Edwards, Jae Young Bang, Nenad ...
As technology scales ever further, device unreliability is creating excessive complexity for hardware to maintain the illusion of perfect operation. In this paper, we consider whe...
Marc de Kruijf, Shuou Nomura, Karthikeyan Sankaral...
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...