492 search results - page 64 / 99 » Reliability and Fault Tolerance in Trust |
MICRO
2009
IEEE
15 years 4 months ago
2009
IEEE
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
ISLPED
2006
ACM
15 years 3 months ago
2006
ACM
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...
ISLPED
2005
ACM
15 years 3 months ago
2005
ACM
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
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Voted
GLVLSI
2003
IEEE
15 years 3 months ago
2003
IEEE
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
ATVA
2007
Springer
15 years 1 months ago
2007
Springer
One of the prerequisites for information society is secure and reliable communication among computing systems. Accordingly, network security appliances become key components of inf...