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72
Voted
ISCA
2010
IEEE
15 years 1 months ago
2010
IEEE
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
120
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VEE
2012
ACM
13 years 5 months ago
2012
ACM
OS-level virtualization generates a minimal start-up and run-time overhead on the host OS and thus suits applications that require both good isolation and high efficiency. However...
70
Voted
DAC
2004
ACM
15 years 10 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
64
Voted
DAC
2006
ACM
15 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
CASES
2006
ACM
15 years 1 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...