37 search results - page 5 / 8 » Reliability evaluation of combinational logic circuits by sy... |
GLVLSI
2003
IEEE
15 years 2 months ago
2003
IEEE
With scaling down to deep submicron and nanometer technologies, noise immunity is becoming a metric of the same importance as power, speed, and area. Smaller feature sizes, low vo...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
DAC
2010
ACM
15 years 27 days ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
FDTC
2006
Springer
15 years 1 months ago
2006
Springer
Abstract. Balanced gates are an effective countermeasure against power analysis attacks only if they can be guaranteed to maintain their power balance. Traditional testing and reli...
MTDT
2003
IEEE
15 years 2 months ago
2003
IEEE
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...