48 search results - page 7 / 10 » Reliability evaluation of multi-component cold-standby redun... |
MICRO
2008
IEEE
15 years 3 months ago
2008
IEEE
Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leadin...
SIGMETRICS
2010
ACM
14 years 9 months ago
2010
ACM
Modern storage systems use thousands of inexpensive disks to meet the storage requirement of applications. To enhance the data availability, some form of redundancy is used. For e...
TC
2011
14 years 4 months ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...
72
Voted
FAST
2010
14 years 12 months ago
2010
Latent sector errors (LSEs) refer to the situation where particular sectors on a drive become inaccessible. LSEs are a critical factor in data reliability, since a single LSE can ...
72
Voted
SASO
2009
IEEE
15 years 4 months ago
2009
IEEE
—In sufficiently large heterogeneous overlays message loss and delays are likely to occur. This has a significant impact on overlay routing, especially on longer paths. The exi...