7 search results - page 2 / 2 » Reliability-aware design for nanometer-scale devices |
79
Voted
ISMVL
2005
IEEE
15 years 3 months ago
2005
IEEE
As logic device sizes shrink towards the nanometer scale, a number of important physical limits threaten to soon halt further improvements in computer performance per unit cost. H...
75
Voted
DAC
2008
ACM
15 years 10 months ago
2008
ACM
In recent literature it has been reported that Dynamic Power Management (DPM) may lead to decreased reliability in real-time embedded systems. The ever-shrinking device sizes cont...