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Reliable Laser Programmable Gate Array Technology
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2009
IEEE
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A new design-for-test technique for SRAM core-cell stability faults
15 years 11 months ago
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—Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern...
Alexandre Ney, Luigi Dilillo, Patrick Girard, Serg...
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