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DAC
2005
ACM
15 years 6 months ago
Logic soft errors in sub-65nm technologies design and CAD challenges
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
Subhasish Mitra, Tanay Karnik, Norbert Seifert, Mi...
RAS
2008
84views more  RAS 2008»
15 years 4 months ago
Monitoring the execution of robot plans using semantic knowledge
Even the best laid plans can fail, and robot plans executed in real world domains tend to do so often. The ability of a robot to reliably monitor the execution of plans and detect...
Abdelbaki Bouguerra, Lars Karlsson, Alessandro Saf...
ICIP
2002
IEEE
16 years 6 months ago
Robust bandlimited watermarking with trellis coded modulation
Digital watermarking is equivalent to bandlimited, powerlimited digital communication. The power limit is due to the requirement of imperceptible watermarks, and has long been rec...
Aria Nosratinia, Vimal Thilak
DAC
2009
ACM
16 years 5 months ago
Computing bounds for fault tolerance using formal techniques
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
André Sülflow, Görschwin Fey, Rol...
CGO
2009
IEEE
15 years 11 months ago
ESoftCheck: Removal of Non-vital Checks for Fault Tolerance
—As semiconductor technology scales into the deep submicron regime the occurrence of transient or soft errors will increase. This will require new approaches to error detection. ...
Jing Yu, María Jesús Garzarán...