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» Representing Process Variation with a Process Family
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CVPR
2008
IEEE
16 years 1 months ago
Selective hidden random fields: Exploiting domain-specific saliency for event classification
Classifying an event captured in an image is useful for understanding the contents of the image. The captured event provides context to refine models for the presence and appearan...
Vidit Jain, Amit Singhal, Jiebo Luo
VIS
2007
IEEE
152views Visualization» more  VIS 2007»
16 years 1 months ago
An Effective Illustrative Visualization Framework Based on Photic Extremum Lines (PELs)
Conveying shape using feature lines is an important visualization tool in visual computing. The existing feature lines (e.g., ridges, valleys, silhouettes, suggestive contours, etc...
Xuexiang Xie, Ying He, Feng Tian, Hock-Soon Sea...
ICPR
2000
IEEE
16 years 26 days ago
Mixture Densities for Video Objects Recognition
The appearance of non-rigid objects detected and tracked in video streams is highly variable and therefore makes the identification of similar objects very complex. Furthermore, i...
Riad I. Hammoud, Roger Mohr
VLSID
2007
IEEE
85views VLSI» more  VLSID 2007»
16 years 5 days ago
Metrics to Quantify Steady and Transient Gate Leakage in Nanoscale Transistors: NMOS vs. PMOS Perspective
In this paper we explore the use of a set of novel design metrics for characterizing the impact of gate oxide tunneling current in nanometer CMOS devices and perform Monte Carlo s...
Elias Kougianos, Saraju P. Mohanty
ICCD
2006
IEEE
123views Hardware» more  ICCD 2006»
15 years 8 months ago
Steady and Transient State Analysis of Gate Leakage Current in Nanoscale CMOS Logic Gates
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...
Saraju P. Mohanty, Elias Kougianos