285 search results - page 45 / 57 » Representing Process Variation with a Process Family |
118
Voted
ICCAD
2007
IEEE
16 years 9 days ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...
109
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ICCD
2008
IEEE
15 years 9 months ago
2008
IEEE
— SRAMs typically represent half of the area and more than half of the transistors on a chip today. Variability increases as feature size decreases, and the impact of variability...
130
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VTC
2007
IEEE
15 years 9 months ago
2007
IEEE
— The characterization of downlink traffic power is an important issue for the design of efficient call admission control (CAC) and radio resource management (RRM) procedures. In...
132
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DAGM
2007
Springer
15 years 9 months ago
2007
Springer
Abstract. We consider the problem of non-rigid, point-to-point registration of two 3D surfaces. To avoid restrictions on the topology, we represent the surfaces as a level-set of t...
130
Voted
WABI
2007
Springer
15 years 9 months ago
2007
Springer
The within-species genetic variation due to recombinations leads to a mosaic-like structure of DNA. This structure can be modeled, e.g. by parsing sample sequences of current DNA w...