285 search results - page 45 / 57 » Representing Process Variation with a Process Family |
ICCAD
2007
IEEE
15 years 8 months ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...
ICCD
2008
IEEE
15 years 6 months ago
2008
IEEE
— SRAMs typically represent half of the area and more than half of the transistors on a chip today. Variability increases as feature size decreases, and the impact of variability...
VTC
2007
IEEE
15 years 6 months ago
2007
IEEE
— The characterization of downlink traffic power is an important issue for the design of efficient call admission control (CAC) and radio resource management (RRM) procedures. In...
DAGM
2007
Springer
15 years 6 months ago
2007
Springer
Abstract. We consider the problem of non-rigid, point-to-point registration of two 3D surfaces. To avoid restrictions on the topology, we represent the surfaces as a level-set of t...
WABI
2007
Springer
15 years 5 months ago
2007
Springer
The within-species genetic variation due to recombinations leads to a mosaic-like structure of DNA. This structure can be modeled, e.g. by parsing sample sequences of current DNA w...